Scanning Ion Conductance Microscope with Booster-Piezo
A home-build scanning ion conductance microscope with a lateral resolution in the range of 70 nm.
This SICM uses a three-way piezo system to position the pipette in alle three dimensions. Addiionally, it uses a fast shear-force piezo to allow for faster approach velocities.
ELC 03X, npi electronic
National Instruments PCI-6259
- Coarse positioning range for the sample
4mm × 4mm
- Coarse positioning range for the pipette
25mm × 25mm
- Scanning type
Pipette scanning in all three dimensions, additional shear-force piezo for fast pipette retraction
- Positioning device for scanning
- Fast pipette retraction piezo
This instrument has been described in detail in