Scanning Ion Conductance Microscope with Booster-Piezo

A home-build scanning ion conductance microscope with a lateral resolution in the range of 70 nm. 

This SICM uses a three-way piezo system to position the pipette in alle three dimensions. Addiionally, it uses a fast shear-force piezo to allow for faster approach velocities.



National Instruments PCI-6259

Coarse positioning range for the sample

4mm × 4mm

Coarse positioning range for the pipette

25mm × 25mm

Scanning type

Pipette scanning in all three dimensions, additional shear-force piezo for fast pipette retraction

Positioning device for scanning
Fast pipette retraction piezo

Further reading

Related Methods