Advanced thin film characterization via highly energetic radiation

This project is dedicated to thin film analysis of materials of interest deposited by the IMC group in a collaborative effort with partners from academia / industry. Primarily, selected metallic thin film samples will be subjected to ion beam and x-ray analysis to gain insights in the effect of deposition technique and parameter variation on thin film composition and functionally exploitable properties.

Methods used

Funded by

This project has no funding.

Publications

  • S. Stefanovic, N. Gheshlaghi, D. Zanders, I. Kundrata, B. Zhao, M. K. S. Barr, M. Halik, A. Devi, J. Bachmann Small, 2023, 2301774: Direct-Patterning ZnO Deposition by Atomic-Layer Additive Manufacturing Using a Safe and Economical Precursor. small 2023 DOI: 10.1002/smll.202301774
  • David Zanders,Prof. Dr. Jason D. Masuda,Bethany Lowe,Dr. Sharon Curtis,Prof. Dr. Dr. h.c. Anjana Devi,Prof. Dr. Seán T. Barry: An Unusual Tri-coordinate Co(II) Silylamide with Potential for Chemical Vapor Deposition Processes. ZAAC 2022 DOI: 10.1002/zaac.202200249

Theses

This project has no theses.