Particle Induced X-ray Emission (PIXE): Projects
Qualitative and quantitative analysis of major and trace elements by PIXE
PIXE technique is applied for the qualitative and quantitative analysis of major and trace elements in various kinds of samples, such as in minerals, glasses, alloys etc. The concentrations of elements from Si up to U can be determined in samples of different structures, i.e. in homogeneous thin or thick samples, as well as in layered ones. The sensitivity of PIXE can reach levels of the order of a few parts per million (ppm).